The semiconductor industry generally requires the purity of silicon wafers to be above 99.9999999%. Accurate detection of impurities in semiconductor manufacturing materials is essential to ensure the quality and yield of components. As modern semiconductor components become smaller and smaller, the potential negative impact of impurities on component speed and profit is also increasing. Alfa Chemistry is equipped with high detection sensitivity and powerful interference removal ability detection equipment, such as high-resolution ICP-MS technology, which can complete ultra-trace amounts of silicon wafer surfaces, monocrystalline silicon ingots, and wafers elemental analysis to reliably control wafer quality. A variety of high-resolution optical/electron/ion microscopes and specific spectrometers / diffractometers are used to control the process flow and analyze the physical structure of semiconductor wafers. Alfa Chemistry has a variety of electron and ion microscopes and other analytical instruments, which can provide customers with wafer analysis at different stages of the industry cycle.